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专利名称：A METHOD AND A DEVICE FOR CHECKING
THE CONDITION OF SEMICONDUCTORVALVES
发明人：NYBERG, Krister,SEPPÄNEN, Ari申请号：EP93919745.0申请日：19930811公开号：EP0671012A1公开日：19950913
摘要：PCT No. PCT/SE93/00662 Sec. 371 Date Feb. 2, 1995 Sec. 102(e) Date Feb. 2, 1995PCT Filed Aug. 11, 1993 PCT Pub. No. WO94/06028 PCT Pub. Date Mar. 17, 1994.Anelectric semiconductor valve (V), for example a valve in a converter for conversionbetween alternating current and high-voltage direct current, comprises a plurality ofsemiconductor positions (TS1, TS2, . . . TSN) with mutually series-connected
semiconductor devices (T1, T2, . . . TN). With the semiconductor valve energized by analternating voltage substantially corresponding to the rated voltage thereof, thecondition of an optional semiconductor position is checked by generating a test firingsignal (FP) and supplying it to the firing channel (L, 1, TCU, 3) of the semiconductorposition alone, whereupon an indicating signal (IP) delivered by the indicating channel(TCU, 2, D) of the semiconductor position is studied with respect to time.
申请人：ASEA BROWN BOVERI AB
地址：S-721 83 Västeras SE
国籍：SE
代理机构：Boecker, Joachim, Dr.-Ing.
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