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专利名称：Method and system for calibrating an
apparatus for measuring the shape of areflective surface
发明人：WIENAND, STEPHAN,RUDERT, ARMIN, DR.申请号：EP08022163.3申请日：20070308公开号：EP2040026A3公开日：20090401
专利附图：
摘要：there are a method and a system for calibrating a device for formmessung areflective surface (14) is described. the device has at least one pattern (15) on the
reflection from the reflective surface (14) and at least one camera (1) to pixelweisencontemplation of the reflective surface (14) reflection pattern (15).to calibration is a tarpreflective referenzoberfl\äche (5.6) created by a liquid in a tub (4) is given. with twodifferent filling levels of the tub (4) are two such plane reflectiverefernzoberfl\ächen (5.6) is created.
申请人：ISRA SURFACE VISION GMBH
地址：Albert-Einstein-Allee 36-40 45699 Herten DE
国籍：DE
代理机构：KEIL & SCHAAFHAUSEN Patentanwälte
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