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专利名称：Method and an apparatus for testing AC
characteristics of an integrated circuit
发明人：Kazumasa Noyori申请号：US07/451878申请日：191218公开号：US05107207A公开日：19920421
摘要：A method of inspecting an integrated circuit comprises the steps of supplyingan alternating signal to a plurality of different circuits in the integrated circuit, andmeasuring a signal corresponding to the alternating signal, which is output from each ofthe circuits.
申请人：KABUSHIKI KAISHA TOSHIBA
代理机构：Finnegan, Henderson, Farabow, Garrett, and Dunner
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