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专利名称：Semiconductor integrated circuit with self-testing
发明人：Koichi Yamashita申请号：US07/134070申请日：19871217公开号：US04910735A公开日：19900320
摘要：A semiconductor integrated circuit comprises a plurality of integrated circuitblocks constructed on a wafer. The integrated circuit blocks are electrically connected toeach other so as to form a system. Each of the integrated circuit blocks comprises a logiccircuit for carrying out a logic operation, a pseudo-random pattern generating circuit forgenerating a pseudo-random pattern signal, a switching circuit for selecting either aninput signal to be processed by the logic circuit or the pseudo-random pattern signal anda data compressing circuit for compressing an output data signal of the logic circuit. Theswitching circuit is responsive to a test enabling signal which is independently applied toeach integrated circuit block so that each integrated circuit block is independently set toeither a test mode or a normal mode, and outputs the selected signal to the logic circuit.
申请人：FUJITSU LIMITED
代理机构：Staas & Halsey
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