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专利名称：Apparatus and method for measuring
electroencephalogram
发明人：Chang-su Ryu,Yoon-seon Song,Seung-chul
Shin,Seung-hoon Nam
申请号：US10165628申请日：20020606
公开号：US20030139683A1公开日：20030724
专利附图：
摘要：An electroencephalogram measuring apparatus which can remove anelectroencephalogram in which noise waves are combined, by considering individual
differences, and a method therefor are provided. The electroencephalogram measuringmethod includes detecting electroencephalogram data of an experimentee; amplifyingthe detected electroencephalogram data, and converting the data into a digital signal;high-speed Fourier transforming the converted digital electroencephalogram data;calculating an output value for each frequency of the Fourier transformedelectroencephalogram; calculating an output value for each frequency of the
electroencephalogram for a predetermined time interval; calculating a relative outputvalue for the ground state of the experimentee, by dividing the output value for eachfrequency at each predetermined time interval by the output value for each frequency ofthe ground state of the corresponding experimentee; and comparing the calculatedrelative output value for each frequency for each predetermined time interval for theground state of the experimentee, with a predetermined value, and if the relative outputvalue for each frequency for each predetermined time interval for the ground state ofthe experimentee is less than the predetermined value, determining that noise waves arenot combined with the electroencephalogram, and outputting the electroencephalogramdata, and if the relative output value for each frequency for each predetermined timeinterval for the ground state of the experimentee is greater than the predeterminedvalue, determining that noise waves are combined with electroencephalogram, and notoutputting the electroencephalogram data.
申请人：RYU CHANG-SU,SONG YOON-SEON,SHIN SEUNG-CHUL,NAM SEUNG-HOON
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